Volume 132 Issue 3 | J. Manuf. Sci. Eng.

Guest Editorial

Kevin Lyons, Ajay Malshe, Kamlakar Rajurkar, Curtis Taylor

J. Manuf. Sci. Eng. June 2010, 132(3): 030301. doi: https://doi.org/10.1115/1.3463643

Topics: Biomedicine , Bridges (Structures) , Coatings , Defense industry , Design , Drugs , Electronics , Engines , Industrial research , Inventions

Special Issue on Nanomanufacturing

Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components

E. B. Brousseau, F. Krohs, E. Caillaud, S. Dimov, O. Gibaru, S. Fatikow

J. Manuf. Sci. Eng. June 2010, 132(3): 030901. doi: https://doi.org/10.1115/1.4001481

Abstract

View articletitled, Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components

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Topics: Atomic force microscopy , Chain , Surface roughness

Comparison of Nickel Nanoparticle-Assisted Diffusion Brazing of Stainless Steel to Conventional Diffusion Brazing and Bonding Processes

S. K. Tiwari, B. K. Paul

J. Manuf. Sci. Eng. June 2010, 132(3): 030902. doi: https://doi.org/10.1115/1.4001554

Abstract

View articletitled, Comparison of Nickel Nanoparticle-Assisted Diffusion Brazing of Stainless Steel to Conventional Diffusion Brazing and Bonding Processes

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Topics: Bonding , Brazing , Diffusion (Physics) , Diffusion bonding (Metals) , Nanoparticles , Nickel , Stainless steel

Error Sources in Atomic Force Microscopy for Dimensional Measurements: Taxonomy and Modeling

F. Marinello, S. Carmignato, A. Voltan, E. Savio, L. De Chiffre

J. Manuf. Sci. Eng. June 2010, 132(3): 030903. doi: https://doi.org/10.1115/1.4001242

Abstract

View articletitled, Error Sources in Atomic Force Microscopy for Dimensional Measurements: Taxonomy and Modeling

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Topics: Atomic force microscopy , Errors , Creep , Instrumentation

Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy

Santiago D. Solares, Gaurav Chawla

J. Manuf. Sci. Eng. June 2010, 132(3): 030904. doi: https://doi.org/10.1115/1.4001579

Abstract

View articletitled, Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy

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Topics: Atomic force microscopy , Cantilevers , Imaging , Probes , Spectroscopy , Carbon nanotubes , Oscillations

Micromachined Ultrasonic Print-Head for Deposition of High-Viscosity Materials

J. Mark Meacham, Amanda O’Rourke, Yong Yang, Andrei G. Fedorov, F. Levent Degertekin, David W. Rosen

J. Manuf. Sci. Eng. June 2010, 132(3): 030905. doi: https://doi.org/10.1115/1.4001551

Abstract

View articletitled, Micromachined Ultrasonic Print-Head for Deposition of High-Viscosity Materials

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Topics: Fluids , Manganese (Metal) , Manufacturing , Micromachining , Nozzles , Photopolymers , Piezoelectric transducers , Printing , Resins , Surface tension

Study of a High Performance AFM Probe-Based Microscribing Process

Keith Bourne, Shiv G. Kapoor, Richard E. DeVor

J. Manuf. Sci. Eng. June 2010, 132(3): 030906. doi: https://doi.org/10.1115/1.4001414

Abstract

View articletitled, Study of a High Performance AFM Probe-Based Microscribing Process

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Topics: Atomic force microscopy , Cutting , Geometry , Stress , Wear , Probes

Integrated Two-Photon Polymerization With Nanoimprinting for Direct Digital Nanomanufacturing

Wande Zhang, Li-Hsin Han, Shaochen Chen

J. Manuf. Sci. Eng. June 2010, 132(3): 030907. doi: https://doi.org/10.1115/1.4001661

Abstract

View articletitled, Integrated Two-Photon Polymerization With Nanoimprinting for Direct Digital Nanomanufacturing

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Topics: Glass , Lasers , Manufacturing , Nanomanufacturing , Photons , Polymerization , Polymers , Nanostructures , Silicon , Wavelength

Unusual Applications of Machining: Controlled Nanostructuring of Materials and Surfaces

C. Saldana, S. Swaminathan, T. L. Brown, W. Moscoso, J. B. Mann, W. D. Compton, S. Chandrasekar

J. Manuf. Sci. Eng. June 2010, 132(3): 030908. doi: https://doi.org/10.1115/1.4001665

Abstract

View articletitled, Unusual Applications of Machining: Controlled Nanostructuring of Materials and Surfaces

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Topics: Copper , Deformation , Machining , Particulate matter , Temperature , Nanomaterials

Tip Based Nanomanipulation Through Successive Directional Push

Wei Zhao, Kangmin Xu, Xiaoping Qian, Rong Wang

J. Manuf. Sci. Eng. June 2010, 132(3): 030909. doi: https://doi.org/10.1115/1.4001676

Abstract

View articletitled, Tip Based Nanomanipulation Through Successive Directional Push

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Topics: Atomic force microscopy , Particulate matter , Algorithms

Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

Zone-Ching Lin, Ming-Ho Chou

J. Manuf. Sci. Eng. June 2010, 132(3): 030910. doi: https://doi.org/10.1115/1.4001685

Abstract

View articletitled, Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

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Topics: Near-field scanning optical microscopy , Optical fiber , Probes , Nanoscale phenomena , Optical microscopes , Atoms , Atomic interactions , Vibration

Rapid Nanomanufacturing of Metallic Break Junctions Using Focused Ion Beam Scratching and Electromigration

Waseem Asghar, Priyanka P. Ramachandran, Adegbenro Adewumi, Mohammud R. Noor, Samir M. Iqbal

J. Manuf. Sci. Eng. June 2010, 132(3): 030911. doi: https://doi.org/10.1115/1.4001664

Abstract

View articletitled, Rapid Nanomanufacturing of Metallic Break Junctions Using Focused Ion Beam Scratching and Electromigration

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Topics: Electrodiffusion , Focused ion beams , Junctions , Metals , Nanomanufacturing , Electron beams , Electrodes

A Quasi-Static Mechanics Analysis of Three-Dimensional Nanoscale Surface Polishing

H. Xu, K. Komvopoulos

J. Manuf. Sci. Eng. June 2010, 132(3): 030912. doi: https://doi.org/10.1115/1.4001582

Abstract

View articletitled, A Quasi-Static Mechanics Analysis of Three-Dimensional Nanoscale Surface Polishing

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Topics: Nanoparticles , Polishing , Surface roughness , Nanoscale phenomena , Steady state , Deformation , Pressure

Analysis of Molecular Beam Epitaxy Process for Growing Nanoscale Magnesium Oxide Films

Ghulam M. Uddin, Zhuhua Cai, Katherine S. Ziemer, Abe Zeid, Sagar Kamarthi

J. Manuf. Sci. Eng. June 2010, 132(3): 030913. doi: https://doi.org/10.1115/1.4001691

Abstract

View articletitled, Analysis of Molecular Beam Epitaxy Process for Growing Nanoscale Magnesium Oxide Films

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Topics: Artificial neural networks , Magnesium (Metal) , Molecular beam epitaxy , Oxygen , Temperature , Experimental design , Nanoscale phenomena

A Statistical Analysis to Control the Growth of Cobalt Ferrite Nanoparticles Synthesized by the Thermodecomposition Method

Victoria L. Calero-DdelC, Ana M. Gonzalez, Carlos Rinaldi

J. Manuf. Sci. Eng. June 2010, 132(3): 030914. doi: https://doi.org/10.1115/1.4001717

Abstract

View articletitled, A Statistical Analysis to Control the Growth of Cobalt Ferrite Nanoparticles Synthesized by the Thermodecomposition Method

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Topics: Cobalt , Ferrites (Magnetic materials) , Nanoparticles , Nucleation (Physics) , Particulate matter , Statistical analysis , Temperature , Experimental design

Pulse Breakdown in Sub-20 nm Organic Dielectrics for Nanoscale-Electromachining (nano-EM)

Kumar R. Virwani, Ajay P. Malshe, Kamlakar P. Rajurkar

J. Manuf. Sci. Eng. June 2010, 132(3): 030915. doi: https://doi.org/10.1115/1.4001718

Abstract

View articletitled, Pulse Breakdown in Sub-20 nm Organic Dielectrics for Nanoscale-Electromachining (nano-EM)

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Topics: Dielectric materials , Electric fields , Flow (Dynamics) , Machining , Nanoscale phenomena , Tungsten , Manufacturing , Compression

Probe-Tip Induced Damage in Compliant Substrates

Michael Chandross, Christian D. Lorenz, Mark J. Stevens, Gary S. Grest

J. Manuf. Sci. Eng. June 2010, 132(3): 030916. doi: https://doi.org/10.1115/1.4001660

Abstract

View articletitled, Probe-Tip Induced Damage in Compliant Substrates

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Topics: Atomic force microscopy , Damage , Engineering simulation , Probes , Simulation , Stress , Shear (Mechanics) , Compression , Tribology , Nanofabrication

Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation

Bijoyraj Sahu, Curtis R. Taylor, Kam K. Leang

J. Manuf. Sci. Eng. June 2010, 132(3): 030917. doi: https://doi.org/10.1115/1.4001662

Abstract

View articletitled, Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation

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Topics: Actuators , Design , Manufacturing , Microactuators , Nanoscale phenomena , Modeling

Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing

Chris Y. Yuan, David A. Dornfeld

J. Manuf. Sci. Eng. June 2010, 132(3): 030918. doi: https://doi.org/10.1115/1.4001686

Abstract

View articletitled, Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing

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Topics: Cycles , Emissions , Energy consumption , Flow (Dynamics) , Manufacturing , Microelectronic devices , Semiconductor wafers , Sustainability , Thin films , Water

Assessment of Microbial Biofilm Growth on Nanocrystalline Diamond in a Continuous Perfusion Environment

J. S. Lewis, S. D. Gittard, R. J. Narayan, C. J. Berry, R. L. Brigmon, R. Ramamurti, R. N. Singh

J. Manuf. Sci. Eng. June 2010, 132(3): 030919. doi: https://doi.org/10.1115/1.4001583

Abstract

View articletitled, Assessment of Microbial Biofilm Growth on Nanocrystalline Diamond in a Continuous Perfusion Environment

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Topics: Chemical vapor deposition , Coatings , Diamond films , Diamonds , Grain size , Biomaterials , Thin films , Flow (Dynamics) , Stainless steel , Density

Process Robustness of Hot Embossing Microfluidic Devices

Thor Eusner, Melinda Hale, David E. Hardt

J. Manuf. Sci. Eng. June 2010, 132(3): 030920. doi: https://doi.org/10.1115/1.4001421

Abstract

View articletitled, Process Robustness of Hot Embossing Microfluidic Devices

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Topics: Design , Embossing , Microfluidics , Response surface methodology , Robustness , Pressure , Polymers , Temperature , Manufacturing

Research Papers

Modeling of Recast Layer in Micro-Electrical Discharge Machining

P. C. Tan, S. H. Yeo

J. Manuf. Sci. Eng. June 2010, 132(3): 031001. doi: https://doi.org/10.1115/1.4001480

Abstract

View articletitled, Modeling of Recast Layer in Micro-Electrical Discharge Machining

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Topics: Computer simulation , Electrical discharge machining , Heat , Heat flux , Machining , Melting , Modeling , Plasmas (Ionized gases) , Finite element methods , Numerical analysis

High Frequency Correction of Dynamometer for Cutting Force Observation in Milling

François Girardin, Didier Remond, Jean-François Rigal

J. Manuf. Sci. Eng. June 2010, 132(3): 031002. doi: https://doi.org/10.1115/1.4001538

Abstract

View articletitled, High Frequency Correction of Dynamometer for Cutting Force Observation in Milling

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Topics: Cutting , Dynamometers , Milling , Signals , Lubricants

Development of Plasma Nanomanufacturing Workcell

King Wai Chiu Lai, Jeffri J. Narendra, Ning Xi, Jiangbo Zhang, Timothy A. Grotjohn, Jes Asmussen

J. Manuf. Sci. Eng. June 2010, 132(3): 031003. doi: https://doi.org/10.1115/1.4001719

Abstract

View articletitled, Development of Plasma Nanomanufacturing Workcell

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Topics: Atomic force microscopy , Etching , Nanomanufacturing , Plasmas (Ionized gases) , Probes , Silicon , Photoresists , Diamonds

Technical Briefs

Identification and Compensation of Dynamic Scale Mismatches in High-Speed End Mill Boring Trajectory on CNC Machines

Mohamed Slamani, Rene Mayer, Marek Balazinski, Serafettin Engin

J. Manuf. Sci. Eng. June 2010, 132(3): 034501. doi: https://doi.org/10.1115/1.4001412

Abstract

View articletitled, Identification and Compensation of Dynamic Scale Mismatches in High-Speed End Mill Boring Trajectory on CNC Machines

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Topics: Errors , Trajectories (Physics) , Machine tools , Machinery

Guest Editorial

Guest Editorial

Special Issue on Nanomanufacturing

Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components

Comparison of Nickel Nanoparticle-Assisted Diffusion Brazing of Stainless Steel to Conventional Diffusion Brazing and Bonding Processes

Error Sources in Atomic Force Microscopy for Dimensional Measurements: Taxonomy and Modeling

Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy

Micromachined Ultrasonic Print-Head for Deposition of High-Viscosity Materials

Study of a High Performance AFM Probe-Based Microscribing Process

Integrated Two-Photon Polymerization With Nanoimprinting for Direct Digital Nanomanufacturing

Unusual Applications of Machining: Controlled Nanostructuring of Materials and Surfaces

Tip Based Nanomanipulation Through Successive Directional Push

Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

Rapid Nanomanufacturing of Metallic Break Junctions Using Focused Ion Beam Scratching and Electromigration

A Quasi-Static Mechanics Analysis of Three-Dimensional Nanoscale Surface Polishing

Analysis of Molecular Beam Epitaxy Process for Growing Nanoscale Magnesium Oxide Films

A Statistical Analysis to Control the Growth of Cobalt Ferrite Nanoparticles Synthesized by the Thermodecomposition Method

Pulse Breakdown in Sub-20 nm Organic Dielectrics for Nanoscale-Electromachining (nano-EM)

Probe-Tip Induced Damage in Compliant Substrates

Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation

Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing

Assessment of Microbial Biofilm Growth on Nanocrystalline Diamond in a Continuous Perfusion Environment

Process Robustness of Hot Embossing Microfluidic Devices

Research Papers

Modeling of Recast Layer in Micro-Electrical Discharge Machining

High Frequency Correction of Dynamometer for Cutting Force Observation in Milling

Development of Plasma Nanomanufacturing Workcell

Technical Briefs

Identification and Compensation of Dynamic Scale Mismatches in High-Speed End Mill Boring Trajectory on CNC Machines

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