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Issues
September 1998
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Editor’s Note
Fiber Optics Structural Mechanics: Brief Review
J. Electron. Packag. September 1998, 120(3): 217–220.
doi: https://doi.org/10.1115/1.2792625
Topics:
Optical fiber
,
Structural analysis
Technical Papers
Analysis of Bending and Shearing of Tri-Layer Laminations for Solder Joint Reliability
J. Electron. Packag. September 1998, 120(3): 221–228.
doi: https://doi.org/10.1115/1.2792626
Topics:
Die cutting
,
Lamination
,
Reliability
,
Shearing (Deformation)
,
Solder joints
,
Fatigue life
,
Shear (Mechanics)
,
Silicon
,
Stress
,
Temperature
Thermal Enhancement Coatings for Microelectronic Systems
J. Electron. Packag. September 1998, 120(3): 229–237.
doi: https://doi.org/10.1115/1.2792627
Topics:
Coatings
,
Electronic components
,
Failure
,
Heat
Avionics Passive Cooling With Microencapsulated Phase Change Materials
J. Electron. Packag. September 1998, 120(3): 238–242.
doi: https://doi.org/10.1115/1.2792628
Topics:
Avionics
,
Cooling
,
Phase change materials
,
Aircraft
,
Aluminum plate
,
Design
,
Heat sinks
,
Missiles
,
Weight (Mass)
Forced Convective Liquid Cooling of Arrays of Protruding Heated Elements Mounted in a Rectangular Duct
J. Electron. Packag. September 1998, 120(3): 243–252.
doi: https://doi.org/10.1115/1.2792629
Topics:
Cooling
,
Ducts
,
Heat
,
Reynolds number
,
Heat transfer
,
Water
,
Algebra
,
Buoyancy
,
Flow (Dynamics)
,
Flow visualization
Random Change of Vibration Modes in Thermosonic Bonding
J. Electron. Packag. September 1998, 120(3): 253–258.
doi: https://doi.org/10.1115/1.2792630
Topics:
Bonding
,
Vibration
,
Friction
,
End effectors
,
Excitation
,
Flip-chip assemblies
,
Generators
,
Modal analysis
,
Process control
,
Resonance
Optimization of Finned Heat Sinks for Impingement Cooling of Electronic Packages
J. Electron. Packag. September 1998, 120(3): 259–266.
doi: https://doi.org/10.1115/1.2792631
Evaluation of Elasto-Plastic Interfacial Fracture Parameters in Solder-Copper Bimaterial Using Moire´ Interferometry
J. Electron. Packag. September 1998, 120(3): 267–274.
doi: https://doi.org/10.1115/1.2792632
Topics:
Copper
,
Fracture (Materials)
,
Fracture (Process)
,
Interferometry
,
Solders
,
Deformation
,
Failure
,
Fracture toughness
,
Geometry
,
Strain gages
Applications of Digital Speckle Correlation to Microscopic Strain Measurement and Materials’ Property Characterization
J. Electron. Packag. September 1998, 120(3): 275–279.
doi: https://doi.org/10.1115/1.2792633
Topics:
Hardware
,
Manufacturing
,
Reliability
,
Resolution (Optics)
,
Strain measurement
The Effects of Material Properties on Heat Dissipation in High Power Electronics
J. Electron. Packag. September 1998, 120(3): 280–289.
doi: https://doi.org/10.1115/1.2792634
Topics:
Electronics
,
Energy dissipation
,
Heat
,
Materials properties
,
Thermal conductivity
,
Cooling
,
Approximation
,
Diamonds
,
Dimensions
,
Insulation
Package-to-Board Attach Reliability — Methodology and Case Study on OMPAC Package
J. Electron. Packag. September 1998, 120(3): 290–295.
doi: https://doi.org/10.1115/1.2792635
Topics:
Reliability
,
Temperature
,
Solders
,
Cycles
,
Finite element methods
,
Simulation
,
Creep
,
Failure
,
Simulation results
,
Ball-Grid-Array packaging
Performance Analysis of Double Stack Cold Plates Covering All Conditions of Asymmetric Heat Loading
J. Electron. Packag. September 1998, 120(3): 296–301.
doi: https://doi.org/10.1115/1.2792636
Topics:
Heat
,
Plates (structures)
,
Temperature
,
Composite materials
,
Fins
,
Stress
A Two-Body Formulation for Solder Joint Shape Prediction
J. Electron. Packag. September 1998, 120(3): 302–308.
doi: https://doi.org/10.1115/1.2792637
Topics:
Shapes
,
Solder joints
,
Solders
,
Drops
,
Ball-Grid-Array packaging
,
Ceramics
,
Design
,
Fatigue life
,
Finite element analysis
,
Flip-chip
Process Induced Stresses of a Flip-Chip Packaging by Sequential Processing Modeling Technique
J. Electron. Packag. September 1998, 120(3): 309–313.
doi: https://doi.org/10.1115/1.2792638
Topics:
Flip-chip
,
Modeling
,
Packaging
,
Stress
,
Manufacturing
,
Deflection
,
Finite element analysis
,
Warping
,
Alloys
,
Bonding
Technical Brief
In Situ Evaluation of Residual Stresses in an Organic Die-Attach Adhesive
J. Electron. Packag. September 1998, 120(3): 314–318.
doi: https://doi.org/10.1115/1.2792639
Topics:
Adhesives
,
Residual stresses
,
Epoxy adhesives
,
Epoxy resins
,
Stress
,
Hardening (Curing)
,
Absorption
,
Cooling
,
Interferometry
,
Relaxation (Physics)
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Optimization of Micro-Pillars Electroplating Bonding Processes and Additives
J. Electron. Packag
Microbead Encapsulation for Protection of Electronic Components
J. Electron. Packag
Performance Analysis of a Brazed Plate Heat Exchanger During Condensation of R1233zd(E)
J. Electron. Packag (June 2025)
Wideband Equivalent Circuit Modeling and Parameter Extraction Method for Through Via in Ceramic Package Substrate
J. Electron. Packag (June 2025)