...Amin Salehi-Khojin; Saeid Bashash; Nader Jalili; Gary Lee Thompson; Alexey Vertegel Piezoresponse force microscopy (PFM) is an atomic force microscopy-based approach utilized for measuring local properties of piezoelectric materials. The objective of this study is to propose a practical framework...

... through base excitation and two piezoelectric elements are attached to the beam for vibration control purposes. The distributed-parameter model for the beam-element system is discretized by using Galerkin’s method, and time histories of the system’s response describe the controller’s attenuation...

... for vibration suppression. In contrast, conventional positive position feedback uses a single second-order compensator. The technique is useful for strain-based sensors and can be applied to piezoelectrically controlled systems. After introducing the concept of modified positive position feedback, this paper...